Mohammad Tehranipoor,Nisar Ahmed: Nanometer Technology Designs
Description
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
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Author: Mohammad Tehranipoor,Nisar Ahmed
Number of Pages: 281 pages
Published Date: 14 Dec 2011
Publisher: Springer-Verlag New York Inc.
Publication Country: New York, NY, United States
Language: English
ISBN: 9781441945594
Download Link: Click Here
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